低壓成套開關(guān)設(shè)備內(nèi)部故障電弧研究
林承志1,蘇金州1,2,張學(xué)軍1,謝宏靈1
(1 福建省產(chǎn)品質(zhì)量檢驗(yàn)研究院,福建 福州 350002;2 福州大學(xué),福建 福州 350108)
摘 要:介紹了低壓成套開關(guān)設(shè)備內(nèi)部故障電弧,結(jié)合標(biāo)準(zhǔn)GB/Z 18859—2002 及IEC/TR 61641,對(duì)低壓成套開關(guān)設(shè)備進(jìn)行內(nèi)部故障引弧試驗(yàn)并對(duì)試驗(yàn)現(xiàn)象進(jìn)行分析,闡述了引起內(nèi)部故障電弧的原因,通過對(duì)樣機(jī)進(jìn)行合理優(yōu)化改造設(shè)計(jì),并采取了必要的故障電弧防護(hù)措施,使得順利通過試驗(yàn),為通過引弧試驗(yàn)提供了參考。
關(guān)鍵詞:低壓成套開關(guān)設(shè)備;故障電??;引弧試驗(yàn);改造設(shè)計(jì);防護(hù)措施
中圖分類號(hào):TM591 文獻(xiàn)標(biāo)識(shí)碼:A 文章編號(hào):1007-3175(2016)11-0044-03
Study on Internal Fault Arc of Low-Voltage Switchgear Assemblies
LIN Cheng-zhi1, SU Jin-zhou1, 2, ZHANG Xue-jun1, XIE Hong-ling1
(1 Fujian Inspection and Research Institute for Product Quality, Fuzhou 350002, China;
2 Fuzhou University, Fuzhou 350108, China)
Abstract: Introduction was made to the internal fault arc of low-voltage switchgear assemblies. Combining with the standard of GB/Z 18859----2002and IEC/TR 61641, this paper carried out the internal fault arc ignition test of low-voltage switchgear assemblies and analyzed its test phenomenon. This paper expounded the cause of internal fault arc. The prototype was optimized and designed. The system carried out the necessary fault arc preventive measures to sweep through the test, which provides references for the arc ignition test.
Key words: low-voltage switchgear assembly; fault arc; arc ignition test; reconstruction design; preventive measure
參考文獻(xiàn)
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[2] IEC/TR61643—2008 Enclosed low-voltage switchgear and controlgear assemblies—Guide for testing under conditions of arcing due to internal fault[S].
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